Eighth International Symposium on Laser Metrology: Macro-, Micro-, and Nano-technologies Applied in Science, Engineering, and Industry : 14-18 February, 2005, Merida, Yucatan, MexicoSPIE, 2005 - 852 sayfa Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature. |
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Active wavefront shaping and analysis Invited Paper 577601 | 1 |
Inprocess shape and roundness measurements at turning machines using a novel laser | 44 |
automated 3point setup for metrology instruments in 3D CAD space 577605 | 56 |
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algorithm amplitude analysis angle aperture applied axis beam splitter calculated calibration cavity coefficient coordinate corner cube crystal deformation detection detector diameter diffraction diffusion digital holography dihedral error displacement distance Eighth International Symposium electrical resistance electronic ellipsoid equation experimental Figure frequency fringe spacing function gauge block grating hologram holographic interferometry intensity interferogram interferometer laser beam laser diode Laser Metrology length lens light linear Mendoza-Santoyo method metrology México mirror modulation Mueller matrix numerical aperture object obtained optical fiber parameters pattern phase shift photodetector pixels plane polarization position Proc pulse reconstruction reference reflection refractive index Relative transmission resolution resonator Rodriguez-Vera rotation sample scanning scattering sensor setup shear shearing interferometer shown in Fig signal spatial speckle spectral SPIE Vol step height surface Symposium on Laser technique temperature thermal uncertainty values VCSEL vector velocity wave wave-front wavelength